Share Email Print
cover

Proceedings Paper

Properties of defect modes in one-dimensional ternary photonic crystal
Author(s): Xia Li; Kang Xie; Hai-Ming Jiang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We have studied the properties of defect modes in one-dimensional ternary photonic crystal with one defect layer using transfer matrix method(TMM). we first compared the transmission spectra of one dimensional ternary photonic crystal with that of one dimensional binary photonic crystal, and found more bandgaps in the ternary structures. Then we are interested in the defect mode properties of the ternary structures, especially the optical sensing abilities. In the special bandgap owned only by the ternary photonic crystals, the defect modes are found to be very sensitive for sensing very small refractive index changes or very small thickness modulations of the defect layer medium. The defect mode wavelength could shift by 3nm for each refractive index change of 0.006, and the defect mode wavelength could shift by 13nm for each thickness change of 10nm. Finally we introduced a negative-refractive-index defect layer into the ternary structure and found that the defect mode wavelength could shift even by 27nm (two times of 13nm) for each thickness change of 10nm.

Paper Details

Date Published: 9 November 2010
PDF: 11 pages
Proc. SPIE 7853, Advanced Sensor Systems and Applications IV, 78531J (9 November 2010); doi: 10.1117/12.868508
Show Author Affiliations
Xia Li, Univ. of Electronic Science and Technology of China (China)
Chengdu Univ. of Technology (China)
Kang Xie, Univ. of Electronic Science and Technology of China (China)
Hai-Ming Jiang, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 7853:
Advanced Sensor Systems and Applications IV
Brian Culshaw; Yanbiao Liao; Anbo Wang; Xiaoyi Bao; Xudong Fan; Lin Zhang, Editor(s)

© SPIE. Terms of Use
Back to Top