Share Email Print
cover

Proceedings Paper

Investigation of the temperature dependent complex index of refraction of infrared thin-film coating materials
Author(s): Lucas C. Alves
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The use of IR optical substrates and thin-films is an integral part of optical system construction for remote sensing instrumentation. From telescopes to multi-spectral imagers, entire optical systems can be built with a relatively small set of materials. The temperature dependence of the optical, mechanical and electronic properties of bulk infrared (IR) materials has been well characterized in the literature [1-5]. Manufacturer and research reports provide some representation of the impact of temperature excursions on the index of refraction (dn/dT), and the absorption profile (dk/dT) of bulk crystalline germanium (Ge) and synthetic crystalline zinc sulphide (ZnS). The availability of empirical data for thin-films, however, is much more limited. These optical constants for as-deposited amorphous thin-films of Ge and ZnS are investigated. Models for the temperature dependent refractive index have been developed using transmittance and reflectance data over the wavelength region between 2.0-20.0 μm. The spectra of manufactured filters are characterized at ambient and cryogenic temperatures (300K-50K) in order to validate the models developed.

Paper Details

Date Published: 25 August 2010
PDF: 8 pages
Proc. SPIE 7786, Current Developments in Lens Design and Optical Engineering XI; and Advances in Thin Film Coatings VI, 778619 (25 August 2010); doi: 10.1117/12.868479
Show Author Affiliations
Lucas C. Alves, Deposition Sciences, Inc. (United States)


Published in SPIE Proceedings Vol. 7786:
Current Developments in Lens Design and Optical Engineering XI; and Advances in Thin Film Coatings VI
R. Barry Johnson; Virendra N. Mahajan; Simon Thibault, Editor(s)

© SPIE. Terms of Use
Back to Top