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Proceedings Paper

How to polish fused silica to obtain the surface damage threshold equals to the bulk damage threshold
Author(s): Troy Alley; Peter Allard; Rod Schuster; David Collier; Arlee V. Smith; Binh T. Do; Alice C. Kilgo
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Paper Abstract

We compared the 1064 nm surface damage thresholds of fused silica polished by three different techniques: 1. A conventional polishing technique: that uses loose Alumina abrasives (lapping) followed by a fine Cerium oxide polish. 2. An alumina polishing process producing surfaces very close to super polished. 3. Process 2 followed by a silica polish until the silica surfaces are super polished. We employed the same measurement technique that proved successful for the bulk damage threshold measurement to measure the damage thresholds of bare silica surfaces polished by the above three polishing techniques. We used an 8-nanosecond, single transverse and longitudinal mode pulsed laser, from a Q-switched Nd:YAG laser. We used the surface third harmonic generation technique to precisely place the focus of the laser beam on the surface of the fused silica window, and to measure the laser focus spot size which was found to be 8 μm in radius.

Paper Details

Date Published: 29 November 2010
PDF: 18 pages
Proc. SPIE 7842, Laser-Induced Damage in Optical Materials: 2010, 784226 (29 November 2010); doi: 10.1117/12.868416
Show Author Affiliations
Troy Alley, Alpine Research Optics (United States)
Peter Allard, Alpine Research Optics (United States)
Rod Schuster, Alpine Research Optics (United States)
David Collier, Alpine Research Optics (United States)
Arlee V. Smith, AS photonics (United States)
Binh T. Do, Sandia National Labs. (United States)
Alice C. Kilgo, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 7842:
Laser-Induced Damage in Optical Materials: 2010
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; M. J. Soileau, Editor(s)

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