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Proceedings Paper

Infrared image enhancement based on the edge detection and mathematical morphology
Author(s): Linlin Zhang; Yuejin Zhao; Liquan Dong; Xiaohua Liu; Xiaomei Yu; Mei Hui; Xuhong Chu; Cheng Gong
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Paper Abstract

The development of the un-cooled infrared imaging technology from military necessity. At present, It is widely applied in industrial, medicine, scientific and technological research and so on. The infrared radiation temperature distribution of the measured object's surface can be observed visually. The collection of infrared images from our laboratory has following characteristics: Strong spatial correlation, Low contrast , Poor visual effect; Without color or shadows because of gray image , and has low resolution; Low definition compare to the visible light image; Many kinds of noise are brought by the random disturbances of the external environment. Digital image processing are widely applied in many areas, it can now be studied up close and in detail in many research field. It has become one kind of important means of the human visual continuation. Traditional methods for image enhancement cannot capture the geometric information of images and tend to amplify noise. In order to remove noise and improve visual effect. Meanwhile, To overcome the above enhancement issues. The mathematical model of FPA unit was constructed based on matrix transformation theory. According to characteristics of FPA, Image enhancement algorithm which combined with mathematical morphology and edge detection are established. First of all, Image profile is obtained by using the edge detection combine with mathematical morphological operators. And then, through filling the template profile by original image to get the ideal background image, The image noise can be removed on the base of the above method. The experiments show that utilizing the proposed algorithm can enhance image detail and the signal to noise ratio.

Paper Details

Date Published: 4 November 2010
PDF: 8 pages
Proc. SPIE 7854, Infrared, Millimeter Wave, and Terahertz Technologies, 785429 (4 November 2010); doi: 10.1117/12.868373
Show Author Affiliations
Linlin Zhang, Beijing Institute of Technology (China)
Yuejin Zhao, Beijing Institute of Technology (China)
Liquan Dong, Beijing Institute of Technology (China)
Xiaohua Liu, Beijing Institute of Technology (China)
Xiaomei Yu, Peking Univ. (China)
Mei Hui, Beijing Institute of Technology (China)
Xuhong Chu, Beijing Institute of Technology (China)
Cheng Gong, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 7854:
Infrared, Millimeter Wave, and Terahertz Technologies
Cunlin Zhang; Xi-Cheng Zhang; Peter H. Siegel; Li He; Sheng-Cai Shi, Editor(s)

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