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Proceedings Paper

Ray tracing in biaxial materials
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Paper Abstract

Algorithms for polarization ray tracing biaxial materials and calculating the directions of ray propagation and energy flow, the refractive indices, and the coupling coefficients for all four resultant reflected and transmitted rays are presented. Examples of polarization state maps, retardance maps and diattenuation maps are generated as a function of angle of incidence for comparing plane parallel plate systems with uniaxial and biaxial materials.

Paper Details

Date Published: 9 September 2010
PDF: 9 pages
Proc. SPIE 7652, International Optical Design Conference 2010, 76521R (9 September 2010); doi: 10.1117/12.868343
Show Author Affiliations
Wai Sze T. Lam, College of Optical Sciences, The Univ. of Arizona (United States)
Stephen McClain, College of Optical Sciences, The Univ. of Arizona (United States)
Greg A. Smith, College of Optical Sciences, The Univ. of Arizona (United States)
Russell Chipman, College of Optical Sciences, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 7652:
International Optical Design Conference 2010
Julie Bentley; Anurag Gupta; Richard N. Youngworth, Editor(s)

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