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Proceedings Paper

Design and fabrication of a far-infrared interferometer
Author(s): Yongqian Wu; Yudong Zhang; Juan Zhang
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Paper Abstract

A far-infrared interferometer which can test ground surface is presented. Both theoretic analyses and experimental results show that the interferometer has the accuracy of λ/100 (RMS). This accuracy is able to meet the requirement of grinding primary mirror. In addition, the design and system performance of the infrared system is presented.

Paper Details

Date Published: 13 October 2010
PDF: 9 pages
Proc. SPIE 7659, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Smart Structures and Materials in Manufacturing and Testing, 765919 (13 October 2010); doi: 10.1117/12.868215
Show Author Affiliations
Yongqian Wu, Institute of Optics and Electronics (China)
Yudong Zhang, Institute of Optics and Electronics (China)
Juan Zhang, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 7659:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Smart Structures and Materials in Manufacturing and Testing
Xiangang Luo; Georg von Freymann, Editor(s)

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