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Proceedings Paper

Analyzing the effect of tool edge radius on cutting temperature in micro-milling process
Author(s): Y. C. Liang; K. Yang; K. N. Zheng; Q. S. Bai; W. Q. Chen; G. Y. Sun
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Paper Abstract

Cutting heat is one of the important physical subjects in the cutting process. Cutting heat together with cutting temperature produced by the cutting process will directly have effects on the tool wear and the life as well as on the workpiece processing precision and surface quality. The feature size of the workpiece is usually several microns. Thus, the tiny changes of cutting temperature will affect the workpiece on the surface quality and accuracy. Therefore, cutting heat and temperature generated in micro-milling will have significantly different effect than the one in the traditional tools cutting. In this paper, a two-dimensional coupled thermal-mechanical finite element model is adopted to determine thermal fields and cutting temperature during the Micro-milling process, by using software Deform-2D. The effect of tool edge radius on effective stress, effective strain, velocity field and cutting temperature distribution in micro-milling of aluminum alloy Al2024-T6 were investigated and analyzed. Also, the transient cutting temperature distribution was simulated dynamically. The simulation results show that the cutting temperature in Micro-milling is lower than those occurring in conventional milling processes due to the small loads and low cutting velocity. With increase of tool edge radius, the maximum temperature region gradually occurs on the contact region between finished surfaced and flank face of micro-cutter, instead of the rake face or the corner of micro-cutter. And this phenomenon shows an obvious size effect.

Paper Details

Date Published: 22 October 2010
PDF: 5 pages
Proc. SPIE 7657, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 765709 (22 October 2010); doi: 10.1117/12.867961
Show Author Affiliations
Y. C. Liang, Harbin Institute of Technology (China)
K. Yang, Harbin Institute of Technology (China)
K. N. Zheng, Harbin Institute of Technology (China)
Q. S. Bai, Harbin Institute of Technology (China)
W. Q. Chen, Harbin Institute of Technology (China)
G. Y. Sun, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 7657:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
Tianchun Ye; Sen Han; Masaomi Kameyama; Song Hu, Editor(s)

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