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Proceedings Paper

FBG array demodulation based on optical wavelet filtering
Author(s): Shiqing Qi; Zhaoxia Wu; Chen Wang; Zhi Kong
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Paper Abstract

This paper proposes a measurement system of vibration acceleration with wavelength division multiplexing and continuous wave tunable frequency. The optical wavelet filter is designed to improve imbalanced and nonlinear optical signal efficiently. So the optical wavelength coded absolutely is completed. Using the electrically-programmable space modulator can filter and select frequency quickly. Besides, the signals of variation voltage produced by the computers' filtering and selecting frequency spectrum signals implement the wavelet transform. At the same time, voltage signals are controlled by the computer's filtering and selecting frequency spectrum signals. In the experiment, according to the frequency spectrum characteristics of the measuring signals, the Morlet wavelet is regarded as the mother one. The center wavelength of the wavelet function variation is controlled by computers. What's more, selecting the wavelet transform parameter values appropriately can control the transmission spectrum of wavelet bandwidth. Then the use of optical wavelet filters can achieve a center wavelength of FBG demodulation. Above all, this modulation method has more advantages such as simple structure, high scanning frequency, high resolution and good linearity over the common scanning filter.

Paper Details

Date Published: 11 October 2010
PDF: 5 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 765631 (11 October 2010); doi: 10.1117/12.867959
Show Author Affiliations
Shiqing Qi, Northeast Univ. at Qinhuangdao (China)
Zhaoxia Wu, Northeast Univ. at Qinhuangdao (China)
Chen Wang, Northeast Univ. at Qinhuangdao (China)
Zhi Kong, Northeast Univ. at Qinhuangdao (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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