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Proceedings Paper

3D millimeter wave tomographic scanner for large size opaque object inspection with different refractive index contrasts
Author(s): A. Younus; S. Salort; B. Brecur; P. Desbarats; P. Mounaix; J.-P. Caumes; E. Abraham
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Paper Abstract

The potential of terahertz technology has been clearly demonstrated by its large applications in security and defence (remote detection of object). A flexible alternative monochromatic millimeter wave system coupled with an original infrared temperature sensor has been developed to visualize large size 3D manufactured opaque phantoms with different refractive index contrasts. The results clearly illustrate applied terahertz tomography particularities such as boundary effects, refraction and diffraction losses that must be prevented for efficient inspection and detection.

Paper Details

Date Published: 12 October 2010
PDF: 7 pages
Proc. SPIE 7837, Millimetre Wave and Terahertz Sensors and Technology III, 783709 (12 October 2010); doi: 10.1117/12.867943
Show Author Affiliations
A. Younus, CPMOH, CNRS, Univ. Bordeaux/ (France)
S. Salort, ALPhANOV (France)
B. Brecur, LABRI, CNRS, Univ. Bordeaux (France)
P. Desbarats, LABRI, CNRS, Univ. Bordeaux (France)
P. Mounaix, CPMOH, CNRS, Univ. Bordeaux (France)
J.-P. Caumes, ALPhANOV (France)
E. Abraham, CPMOH, CNRS, Univ. Bordeaux (France)


Published in SPIE Proceedings Vol. 7837:
Millimetre Wave and Terahertz Sensors and Technology III
Keith A. Krapels; Neil A. Salmon, Editor(s)

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