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Proceedings Paper

Effect of corona poling on structure evolutions of α-phase and β-phase PVDF films
Author(s): Yingxue Xi; Huiqing Fan; Weiguo Li; Xiaoling Niu
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Paper Abstract

In this work, Static piezoelectric measuring tester was used to examine piezoelectric strain constant variations as function of corona fields; it also introduced XRD experiments were carried out on PVDF films with different corona voltage. Such information may be relevant in identifying changes in the degree of crystallinity and crystalline phase changes that occur during poling process. Complementary information was also obtained by performing differential scanning calorimetry (DSC) studies of the same samples. The results show that the poled films exhibit better piezoelectric properties than non-poled ones due to structural changes during corona poling process. A decrease in the degree of crystallinity is found and better piezoelectric characteristics can be obtained in poled β-phase films. However, the value of piezoelectric strain constant of poled α-phase films was relative lower in comparison with β-phase ones due to existence of a considerable number of non-polar phase content in crystalline region.

Paper Details

Date Published: 22 October 2010
PDF: 6 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 765852 (22 October 2010); doi: 10.1117/12.867755
Show Author Affiliations
Yingxue Xi, Northwestern Polytechnical Univ. (China)
Xi'an Technological Univ. (China)
Huiqing Fan, Northwestern Polytechnical Univ. (China)
Weiguo Li, Xi'an Technological Univ. (China)
Xiaoling Niu, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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