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Proceedings Paper

A programmable beam shaping system for tailoring the profile of high fluence laser beams
Author(s): John Heebner; Michael Borden; Phil Miller; Chris Stolz; Tayyab Suratwala; Paul Wegner; Mark Hermann; Mark Henesian; Christopher Haynam; Steve Hunter; Kim Christensen; Nan Wong; Lynn Seppala; Gordon Brunton; Eddy Tse; Abdul Awwal; Mark Franks; Ed Marley; Kevin Williams; Michael Scanlan; Tracy Budge; Marcus Monticelli; Dan Walmer; Sham Dixit; Clay Widmayer; Justin Wolfe; Jeff Bude; Kelly McCarty; Jean-Michel DiNicola
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Paper Abstract

Customized spatial light modulators have been designed and fabricated for use as precision beam shaping devices in fusion class laser systems. By inserting this device in a low-fluence relay plane upstream of the amplifier chain, "blocker" obscurations can be programmed into the beam profile to shadow small isolated flaws on downstream optical components that might otherwise limit the system operating energy. In this two stage system, 1920 × 1080 bitmap images are first imprinted on incoherent, 470 nm address beams via pixelated liquid crystal on silicon (LCoS) modulators. To realize defined masking functions with smooth apodized shapes and no pixelization artifacts, address beam images are projected onto custom fabricated optically-addressable light valves. Each valve consists of a large, single pixel liquid cell in series with a photoconductive Bismuth silicon Oxide (BSO) crystal. The BSO crystal enables bright and dark regions of the address image to locally control the voltage supplied to the liquid crystal layer which in turn modulates the amplitude of the coherent beams at 1053 nm. Valves as large as 24 mm × 36 mm have been fabricated with low wavefront distortion (<0.5 waves) and antireflection coatings for high transmission (>90%) and etalon suppression to avoid spectral and temporal ripple. This device in combination with a flaw inspection system and optic registration strategy represents a new approach for extending the operational lifetime of high fluence laser optics.

Paper Details

Date Published: 2 December 2010
PDF: 6 pages
Proc. SPIE 7842, Laser-Induced Damage in Optical Materials: 2010, 78421C (2 December 2010); doi: 10.1117/12.867728
Show Author Affiliations
John Heebner, Lawrence Livermore National Lab. (United States)
Michael Borden, Lawrence Livermore National Lab. (United States)
Phil Miller, Lawrence Livermore National Lab. (United States)
Chris Stolz, Lawrence Livermore National Lab. (United States)
Tayyab Suratwala, Lawrence Livermore National Lab. (United States)
Paul Wegner, Lawrence Livermore National Lab. (United States)
Mark Hermann, Lawrence Livermore National Lab. (United States)
Mark Henesian, Lawrence Livermore National Lab. (United States)
Christopher Haynam, Lawrence Livermore National Lab. (United States)
Steve Hunter, Lawrence Livermore National Lab. (United States)
Kim Christensen, Lawrence Livermore National Lab. (United States)
Nan Wong, Lawrence Livermore National Lab. (United States)
Lynn Seppala, Lawrence Livermore National Lab. (United States)
Gordon Brunton, Lawrence Livermore National Lab. (United States)
Eddy Tse, Lawrence Livermore National Lab. (United States)
Abdul Awwal, Lawrence Livermore National Lab. (United States)
Mark Franks, Lawrence Livermore National Lab. (United States)
Ed Marley, Lawrence Livermore National Lab. (United States)
Kevin Williams, Lawrence Livermore National Lab. (United States)
Michael Scanlan, Lawrence Livermore National Lab. (United States)
Tracy Budge, Lawrence Livermore National Lab. (United States)
Marcus Monticelli, Lawrence Livermore National Lab. (United States)
Dan Walmer, Lawrence Livermore National Lab. (United States)
Sham Dixit, Lawrence Livermore National Lab. (United States)
Clay Widmayer, Lawrence Livermore National Lab. (United States)
Justin Wolfe, Lawrence Livermore National Lab. (United States)
Jeff Bude, Lawrence Livermore National Lab. (United States)
Kelly McCarty, Lawrence Livermore National Lab. (United States)
Jean-Michel DiNicola, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 7842:
Laser-Induced Damage in Optical Materials: 2010
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; M. J. Soileau, Editor(s)

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