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Proceedings Paper

Electron microscopy of polymer-carbon nanotubes composites
Author(s): E. M. Campo; H. Campanella; Y. Y. Huang; K. Zinoviev; N. Torras; C. Tamargo; D. Yates; L. Rotkina; J. Esteve; E. M. Terentjev
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Paper Abstract

Characterization of polymer nanocomposites by electron microscopy has been attempted since last decade. Main drives for this effort were analysis of dispersion and alignment of fillers in the matrix. Sample preparation, imaging modes and irradiation conditions became particularly challenging due to the small dimension of the fillers and also to the mechanical and conductive differences between filler and matrix. To date, no standardized dispersion and alignment process or characterization procedures exist in the trade. Review of current state of the art on characterization of polymer nanocomposites suggests that the most innovative electron and ion beam microscopy has not yet been deployed in this material system. Additionally, recently discovered functionalities of these composites, such as electro and photoactuation are amenable to the investigation of the atomistic phenomena by in situ transmission electron microscopy. The possibility of using innovative thinning techniques is presented.

Paper Details

Date Published: 7 June 2010
PDF: 5 pages
Proc. SPIE 7729, Scanning Microscopy 2010, 772904 (7 June 2010); doi: 10.1117/12.867718
Show Author Affiliations
E. M. Campo, Instituto de Microelectrónica de Barcelona (Spain)
H. Campanella, Instituto de Microelectrónica de Barcelona (Spain)
Y. Y. Huang, Univ. of Cambridge (United Kingdom)
K. Zinoviev, Instituto de Microelectrónica de Barcelona (Spain)
N. Torras, Instituto de Microelectrónica de Barcelona (Spain)
C. Tamargo, Instituto de Microelectrónica de Barcelona (Spain)
D. Yates, Univ. of Pennsylvania (United States)
L. Rotkina, Univ. of Pennsylvania (United States)
J. Esteve, Instituto de Microelectrónica de Barcelona (Spain)
E. M. Terentjev, Univ. of Cambridge (United Kingdom)

Published in SPIE Proceedings Vol. 7729:
Scanning Microscopy 2010
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy, Editor(s)

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