Share Email Print
cover

Proceedings Paper

Adaptive optimization agorithm for CDS control parameters of high-speed CCD
Author(s): Site Mo; Qi Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The signal-to-noise ratio of the charge coupled devices (CCD) output can be improved by the optimization of control parameters of correlated double sampling (CDS), however, the control parameters of CDS of high-speed CCD is difficult to determine from experiments. In this paper, an adaptive algorithm is proposed to adjust the control parameters of CDS. With fixed target and exposure parameters, the CDS control parameters such as the width of reset pulse, the timing of noise sampling and data sampling are tuned. The images on all combination of the CDS control parameters are acquired. The square sum of the Tenengrad function of all pixels on each image is used to evaluate the quality of the image. The combination of the three CDS parameters corresponding to the maximum sum is chosen as the CDS control parameters, and then the signal-to-noise ratio of the CCD out is the best. Finally, the algorithm is implemented in FPGA and the experiments results show that, compared with the best image acquired without adaptive algorithm, the parameters of edge profile improved from 507.4 to 763.8, the parameters of MTF50 improved from 526.5 to 937.8.

Paper Details

Date Published: 22 October 2010
PDF: 7 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 76582C (22 October 2010); doi: 10.1117/12.867639
Show Author Affiliations
Site Mo, Sichuan Univ. (China)
Qi Liu, Sichuan Univ. (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

© SPIE. Terms of Use
Back to Top