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Proceedings Paper

Distinguishing different parts of objects by terahertz imaging
Author(s): Jin Ge; Reng Wang; Shuhong Hu; Ning Dai; Dong Li; Hong Ma; Guohong Ma
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Paper Abstract

Since every matter has its distinctive absorption and transmission capacity of terahertz, Terahertz time domain spectroscopy provides a powerful means to distinguish the different parts of objects. The transmittance of terahertz under different frequency can reflect the absorption distribution of the different parts of the samples. The phase shift of the terahertz wave indicates the change of optical thickness of the sample. Tree leaves, plastic ring, plastic convex lens and plastic piece with a small hole have been imaged by terahertz. As widespread samples, leaves are proved to be well imaged by terahertz wave. For the moisture content at different parts of leaves, such as mesophyll and vein, is not the same, the absorption of terahertz at these parts are quite different. At 1.4THz, the leaf's image is of good quality and the vein grids are well shown. The hole and defects in the plastic ring are also clearly shown in the THz image because the phase shifts of terahertz in different parts, such as air, defects or plastic region are not the same. It is also shown that objects with large radius of curvature are suitable for THz imagining and the scattering of THz does not affect THz phase information too much. In short, Terahertz imaging is a powerful technique to distinguish the different parts of most objects as long as the absorption of THz is not very strong.

Paper Details

Date Published: 22 October 2010
PDF: 9 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 76584F (22 October 2010); doi: 10.1117/12.867571
Show Author Affiliations
Jin Ge, Shanghai Institute of Technical Physics (China)
Reng Wang, Shanghai Institute of Technical Physics (China)
Shuhong Hu, Shanghai Institute of Technical Physics (China)
Ning Dai, Shanghai Institute of Technical Physics (China)
Dong Li, Shanghai Univ. (China)
Hong Ma, Shanghai Univ. (China)
Guohong Ma, Shanghai Univ. (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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