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Proceedings Paper

Chirp estimation of PZT for integrating-bucket method
Author(s): Jian Zhang; Zhenguang Shi; Erlong Miao; Yongqiang Gu; Weiqi Liu
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Paper Abstract

The nonlinear response of the PZT for the integrating bucket method is studied by our proposed method: discrete chirp Fourier transform (DCFT) and maximum likelihood estimation (MLE) techniques for the integrating bucket method. Based on the signal processing theory, the intensity obtained from CCD is processed by the DCFT and thus nonlinear response and chirp coefficient of the PZT can be coarsely estimated. This is followed by the MLE method, in which an iterative optimization process is complemented for accurately estimating the nonlinear response and chirp coefficient of the PZT. One key advantage of the proposed method is that not only the nonlinear response and chirp coefficient of the PZT can be acquired, but also initial phase acquired. Our method is tested by simulating conditions under which a certain magnitude of nonlinearity is assumed. Nonlinear response attained by the DCFT is compared to that attained by the MLE, and a difference between the actual nonlinear response of the PZT and our accurate estimation by the proposed method is revealed. Several factors that will have influence on the nonlinear response of the PZT are discussed.

Paper Details

Date Published: 12 October 2010
PDF: 7 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76564A (12 October 2010); doi: 10.1117/12.867523
Show Author Affiliations
Jian Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of CAS (China)
Zhenguang Shi, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Erlong Miao, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Yongqiang Gu, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Weiqi Liu, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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