Share Email Print
cover

Proceedings Paper

Performance evaluation of Biograph PET/CT system based on Monte Carlo simulation
Author(s): Bing Wang; Fei Gao; Hua-Feng Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Combined lutetium oxyorthosilicate (LSO) Biograph PET/CT is developed by Siemens Company and has been introduced into medical practice. There is no septa between the scintillator rings, the acquisition mode is full 3D mode. The PET components incorporate three rings of 48 detector blocks which comprises a 13×13 matrix of 4×4×20mm3 elements. The patient aperture is 70cm, the transversal field of view (FOV) is 58.5cm, and the axial field of view is 16.2cm. The CT components adopt 16 slices spiral CT scanner. The physical performance of this PET/CT scanner has been evaluated using Monte Carlo simulation method according to latest NEMA NU 2-2007 standard and the results have been compared with real experiment results. For PET part, in the center FOV the average transversal resolution is 3.67mm, the average axial resolution is 3.94mm, and the 3D-reconstructed scatter fraction is 31.7%. The sensitivities of the PET scanner are 4.21kcps/MBq and 4.26kcps/MBq at 0cm and 10cm off the center of the transversal FOV. The peak NEC is 95.6kcps at a concentration of 39.2kBq/ml. The spatial resolution of CT part is up to 1.12mm at 10mm off the center. The errors between simulated and real results are permitted.

Paper Details

Date Published: 13 October 2010
PDF: 6 pages
Proc. SPIE 7659, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Smart Structures and Materials in Manufacturing and Testing, 765909 (13 October 2010); doi: 10.1117/12.867469
Show Author Affiliations
Bing Wang, Zhejiang Univ. (China)
Fei Gao, Rochester Institute of Technology (United States)
Hua-Feng Liu, Zhejiang Univ. (China)
Rochester Institute of Technology (China)


Published in SPIE Proceedings Vol. 7659:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Smart Structures and Materials in Manufacturing and Testing
Xiangang Luo; Georg von Freymann, Editor(s)

© SPIE. Terms of Use
Back to Top