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Proceedings Paper

Edge detection based on multi-scale wavelet
Author(s): Tingwan Wu; Yihui Duan; Baoliang Liu
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Paper Abstract

In this paper, we present a novel wavelet-based algorithm for multi-scale edge detection. Firstly, calculate wavelet transform coefficients of the image according to the direction of the gradient. Then scan the neighborhood of the corresponding wavelet transform coefficients separately at three-scales, in order to position edges at a small scale and suppress noise at a large scale. The simulation results show that the new algorithm is feasible and effective, more details can be detected. Image clarity handled with new wavelet edge detection algorithm is superior to that of the best currently with Canny operator. For different input image, the novel algorithm can make us get a better edge map.

Paper Details

Date Published: 19 August 2010
PDF: 6 pages
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78200G (19 August 2010); doi: 10.1117/12.867458
Show Author Affiliations
Tingwan Wu, South China Univ. of Technology (China)
Yihui Duan, South China Univ. of Technology (China)
Baoliang Liu, South China Univ. of Technology (China)


Published in SPIE Proceedings Vol. 7820:
International Conference on Image Processing and Pattern Recognition in Industrial Engineering
Shaofei Wu; Zhengyu Du; Shaofei Wu; Zhengyu Du; Shaofei Wu; Zhengyu Du, Editor(s)

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