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Proceedings Paper

Simulation of modal wavefront sensor employed multiplexed holographic optical elements
Author(s): Changhai Liu; Zongfu Jiang; Shengyang Huang; Haotong Ma; Fengjie Xi
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Paper Abstract

Detailed analysis was carried out upon the modal wavefront sensor (MWFS) employed multiple holographic optical elements(MHOEs). The distribution of diffraction field on the detector plane of the MWFS was present, and further deduction was made to gain an analytical expression of intensity distribution of the diffraction field, which resulted in the unification with the theory of mode-biased wavefront sensor. For sake of simplicity in numerical simulation of the MWFS, we have done some modification to the original approach. An equivalent model of the MWFS has been proposed, in which we choose two tilt conjugate plane waves to replace the tilt convergent spherical waves as the reference waves in recording holograms, and place a convergent lens in close proximity to the rear surface of holographic element. We validated the principle of the MWFS by numerical simulations employed the equivalent model. The simulation results were consistent with the theoretical ones.

Paper Details

Date Published: 22 October 2010
PDF: 9 pages
Proc. SPIE 7657, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 765707 (22 October 2010); doi: 10.1117/12.867245
Show Author Affiliations
Changhai Liu, National Univ. of Defense Technology (China)
Zongfu Jiang, National Univ. of Defense Technology (China)
Shengyang Huang, National Univ. of Defense Technology (China)
Haotong Ma, National Univ. of Defense Technology (China)
Fengjie Xi, National Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 7657:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
Tianchun Ye; Sen Han; Masaomi Kameyama; Song Hu, Editor(s)

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