Share Email Print

Proceedings Paper

Identification of the laser-induced damage mechanisms in KDP by coupling 355nm and 1064nm nanosecond pulses
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Nanosecond Laser-Induced Damage (LID) in potassium dihydrogen phosphate (KH2PO4 or KDP) remains an issue for light-frequency converters in large-aperture lasers such as NIF (National Ignition Facility, in USA) and LMJ (Laser MegaJoule, in France). In the final optic assembly, converters are simultaneously illuminated by multiple wavelengths during the frequency conversion. In this configuration, the damage resistance of the KDP crystals becomes a crucial problem and has to be improved. In this study, we propose a refined investigation about the LID mechanisms involved in the case of a multiple wavelengths combination. Experiments based on an original pump-pump set-up have been carried out in the nanosecond regime on a KDP crystal. In particular, the impact of a simultaneous mixing of 355 nm and 1064 nm pulses has been experimentally studied and compared to a model based on heat transfer, the Mie theory and a Drude model. This study sheds light on the physical processes implied in the KDP laser damage. In particular, a three-photon ionization mechanism is shown to be responsible for laser damage in KDP.

Paper Details

Date Published: 29 November 2010
PDF: 7 pages
Proc. SPIE 7842, Laser-Induced Damage in Optical Materials: 2010, 78420T (29 November 2010); doi: 10.1117/12.867234
Show Author Affiliations
S. Reyné, Commissariat à l'Énergie Atomique (France)
G. Duchateau, Commissariat à l'Énergie Atomique (France)
J.-Y. Natoli, Institut Fresnel, CNRS, Aix Marseille Univ. (France)
L. Lamaignère, Commissariat à l'Énergie Atomique (France)

Published in SPIE Proceedings Vol. 7842:
Laser-Induced Damage in Optical Materials: 2010
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; M. J. Soileau, Editor(s)

© SPIE. Terms of Use
Back to Top