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Proceedings Paper

Error analysis and system optimization of non-null aspheric testing system
Author(s): Yongjie Luo; Yongying Yang; Dong Liu; Chao Tian; Yongmo Zhuo
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Paper Abstract

A non-null aspheric testing system, which employs partial null lens (PNL for short) and reverse iterative optimization reconstruction (ROR for short) technique, is proposed in this paper. Based on system modeling in ray tracing software, the parameter of each optical element is optimized and this makes system modeling more precise. Systematic error of non-null aspheric testing system is analyzed and can be categorized into two types, the error due to surface parameters of PNL in the system modeling and the rest from non-null interferometer by the approach of error storage subtraction. Experimental results show that, after systematic error is removed from testing result of non-null aspheric testing system, the aspheric surface is precisely reconstructed by ROR technique and the consideration of systematic error greatly increase the test accuracy of non-null aspheric testing system.

Paper Details

Date Published: 11 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76560N (11 October 2010); doi: 10.1117/12.867070
Show Author Affiliations
Yongjie Luo, Zhejiang Univ. (China)
Yongying Yang, Zhejiang Univ. (China)
Dong Liu, Zhejiang Univ. (China)
Chao Tian, Zhejiang Univ. (China)
Yongmo Zhuo, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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