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Proceedings Paper

Inspection focus technology of space tridimensional mapping camera based on astigmatic method
Author(s): Zhi Wang; Liping Zhang
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Paper Abstract

The CCD plane of the space tridimensional mapping camera will be deviated from the focal plane(including the CCD plane deviated due to camera focal length changed), under the condition of space environment and vibration, impact when satellite is launching, image resolution ratio will be descended because defocusing. For tridimensional mapping camera, principal point position and focal length variation of the camera affect positioning accuracy of ground target, conventional solution is under the condition of vacuum and focusing range, calibrate the position of CCD plane with code of photoelectric encoder, when the camera defocusing in orbit, the magnitude and direction of defocusing amount are obtained by photoelectric encoder, then the focusing mechanism driven by step motor to compensate defocusing amount of the CCD plane. For tridimensional mapping camera, under the condition of space environment and vibration, impact when satellite is launching, if the camera focal length changes, above focusing method has been meaningless. Thus, the measuring and focusing method was put forward based on astigmation, a quadrant detector was adopted to measure the astigmation caused by the deviation of the CCD plane, refer to calibrated relation between the CCD plane poison and the asrigmation, the deviation vector of the CCD plane can be obtained. This method includes all factors caused deviation of the CCD plane, experimental results show that the focusing resolution of mapping camera focusing mechanism based on astigmatic method can reach 0.25 μm.

Paper Details

Date Published: 22 October 2010
PDF: 5 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 765822 (22 October 2010); doi: 10.1117/12.867059
Show Author Affiliations
Zhi Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Liping Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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