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Proceedings Paper

Thinned-cladding zeolite-coated long period fiber grating chemical sensor
Author(s): Gao Shen; Lan Jiang; Sumei Wang; Benye Li; Lanying Zhou; Hai-Lung Tsai; Hai Xiao
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Paper Abstract

This study proposes a thinned-cladding zeolite coated long period fiber grating (LPFG) chemical sensor. The cladding outside the grating zone is etched by hydrofluoric (HF) acid, and then the zeolite film is coated on the thinned grating. The sensitivity characteristics of the LPFG to different external refractive indices are investigated. By etching cladding, the resonant wavelength shifts towards the longer wavelength (red shift) while the attenuation band depth is increased. In addition, with very large surface-to-mass ratio, zeolitic pores can efficiently adsorb molecules from the ambient for highly sensitive detections. The adsorbed analyte molecules are collected and aligned in nanoscale zeolite pores. This leads to changes in the refractive index of zeolite coating, which in turn, causes resonant wavelength shift. After zeolite coating, the resonant wavelength shifts towards the shorter wavelength (blue shift) and the sensitivity to external refractive index is enhanced. The resonant wavelength of uncoated LPFG is 1563.1 nm in air and 1560.5 nm in water, with the wavelength shift of 2.6 nm, while the resonant wavelength of zeolite coated LPFG is 1543.2 nm in air. Decreases in cladding diameters and ziolite coating can effectively enhance the refractive index sensitivity of LPFG chemical sensor.

Paper Details

Date Published: 22 October 2010
PDF: 6 pages
Proc. SPIE 7657, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 76570F (22 October 2010); doi: 10.1117/12.867031
Show Author Affiliations
Gao Shen, Beijing Institute of Technology (China)
Lan Jiang, Beijing Institute of Technology (China)
Sumei Wang, Beijing Institute of Technology (China)
Benye Li, Beijing Institute of Technology (China)
Lanying Zhou, Beijing Institute of Technology (China)
Hai-Lung Tsai, Missouri Univ. of Science and Technology (United States)
Hai Xiao, Missouri Univ. of Science and Technology (United States)


Published in SPIE Proceedings Vol. 7657:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems

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