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Proceedings Paper

Performance of mode-biased wavefront sensor to detect multiple aberration modes
Author(s): Changhai Liu; Zongfu Jiang; Shengyang Huang; Haotong Ma; Fengjie Xi
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Paper Abstract

We investigated the performance of mode-biased wavefront sensor(MWFS) to detect aberration including multiple modes. Two important parameters, Sensitivity and dynamic range, were chosen as criterions to evaluate the performance of the MWFS. We describe the tested wavefront as the superposition of several aberration modes, and considered it in three situations, in which the tested wavefront including: (a) only identical modes,(b) only relevant aberration modes,(c) only irrelevant aberration modes , relative to the biased ones. We show that the existence of the above three types of aberration modes in the tested wavefront greatly impacts the detection performance of the MWFS in terms of the sensitivity and dynamic range.

Paper Details

Date Published: 11 October 2010
PDF: 8 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76560M (11 October 2010); doi: 10.1117/12.866939
Show Author Affiliations
Changhai Liu, National Univ. of Defense Technology (China)
Zongfu Jiang, National Univ. of Defense Technology (China)
Shengyang Huang, National Univ. of Defense Technology (China)
Haotong Ma, National Univ. of Defense Technology (China)
Fengjie Xi, National Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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