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Proceedings Paper

Assess image blur in photoelectric imaging system
Author(s): Xiaofu Xie; Jin Zhou; Qinzhang Wu
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Paper Abstract

The difficulty for no-reference image quality assessment is the lack of the information of the reference image. With the analysis of the mathematical model of the photoelectric imaging system and the reason for image blur, a method is proposed for constructing reference images, and at the same time the Structural Similarity index is introduced into noreference image quality assessment. A novel no-reference image quality assessment index called No-Reference Structural Sharpness is then proposed for quality evaluation of blurred images. This method constructs a reference image by a low-pass filter, and assesses the image quality by computing the structural similarity index between the original image and the reference one, thus considering the mathematical model of imaging system as well as the advantages of Structural Similarity index. The experimental results show that the new index is well in accordance with quality assessment results of both subjective evaluation and full-reference methods.

Paper Details

Date Published: 22 October 2010
PDF: 6 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 765803 (22 October 2010); doi: 10.1117/12.866938
Show Author Affiliations
Xiaofu Xie, Institute of Optics and Electronics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Jin Zhou, Institute of Optics and Electronics (China)
Qinzhang Wu, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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