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Proceedings Paper

Straight interference fringes thinning algorithm
Author(s): Zhen Ren; Zebin Fan; Ping Ran; Junchang Li
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Paper Abstract

The straight interference fringes are very common in the optical measurement such as Michelson interferometer, interference of wedge, the diffraction of single slit, double slits, grating diffraction, the diffraction of thin straight line, speckle correlation technique, moiré topography. etc. With the rapid development of CCD and computer technology, the interference fringes are treated with efficient and fast image processing technique. Usually every interference fringe has certain width and is of low contrast, and even there are gaps or holes in the fringes, the central position is difficult to be located, therefore, the study of fringes thinning algorithm is an interesting subject. Many different algorithms have been presented, every algorithm has its own shortcomings, such as complication of the algorithm, there are spurs or discontinues on the final fringes, or unable to treat the low signal to noise ratio fringes. In this paper a robust and simple algorithm has presented, which mainly including morphological image processing and unusually implement of 1×N median filter to strengthen the horizontal fringes(supposing the fringes are in horizontal direction), to remove spurs and to fill the gaps in the fringes. The experiment result confirmed the validation and robust of the algorithm. Even though the image to be treated is of low signal to noise ratio and low contrast, smooth and continue straight fringes free of spurs could be obtained.

Paper Details

Date Published: 13 October 2010
PDF: 5 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76565R (13 October 2010); doi: 10.1117/12.866930
Show Author Affiliations
Zhen Ren, Kunming Univ. of Science and Technology (China)
Zebin Fan, Kunming Univ. of Science and Technology (China)
Ping Ran, Kunming Univ. of Science and Technology (China)
Junchang Li, Kunming Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

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