Share Email Print
cover

Proceedings Paper

Some novel combining approaches to reduce speckle noises
Author(s): Xu Yang; Zebin Fan; Jinbin Gui; Yuli Lou
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In the optical test and measurement, speckle noise is a commonly noise which spoils the quality of the optical images, therefore, how to eliminate this kind of noise and keep the high frequency detail is an important subject, there have been presented many approaches such as adaptive median filtering in space domain, low pass filter in frequency domain and wavelet based approaches. Different filter has its own advantage and disadvantage, some filtering method is complicated and inconvenient for practice application. And the wavelet-based methods usually blurred the image. Therefore to find a simple and robust filtering method is valuable and important for speckle reduction. In this paper on the bases of theory analysis and simulation, an approach which combines the advantage of wavelet analysis, adaptive median filtering and Gauss filtering technique have been presented. The de-noising effect is evaluated with Signal to Noise Ratio (SNR), The simulation results demonstrate that the combining de-noise approaches are better than single method.

Paper Details

Date Published: 11 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76560Q (11 October 2010); doi: 10.1117/12.866926
Show Author Affiliations
Xu Yang, Kunming Univ. of Science and Technology (China)
Zebin Fan, Kunming Univ. of Science and Technology (China)
Jinbin Gui, Kunming Univ. of Science and Technology (China)
Yuli Lou, Kunming Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top