Share Email Print

Proceedings Paper

Novel optoelectronic system for fast acquisition of reflection spectra
Author(s): V. Teplov; L. Fauch; R. Saarenheimo; E. Nippolainen; A. A. Kamshilin
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present novel optical system capable for fast acquisition of two-dimensional distribution of reflection spectra with high spatial resolution. It is based on a subspace vector model of surface reflections. The system consists of a computer controlled set of light-emitting diodes (LED) and a monochrome CCD camera. Spatial distribution of reflection spectra is acquired in the compressed form. These compressed data can be directly used for accurate classification or recognition of different parts of the surface under study. We demonstrated experimentally that 2D distribution of spectral reflectance from the object surface can be captured within 140ms. Such a fast instrument of multispectral imaging could be extremely useful particularly for researchers who study living biological objects.

Paper Details

Date Published: 17 May 2010
PDF: 9 pages
Proc. SPIE 7469, ROMOPTO 2009: Ninth Conference on Optics: Micro- to Nanophotonics II, 74690S (17 May 2010); doi: 10.1117/12.866772
Show Author Affiliations
V. Teplov, Univ. of Eastern Finland (Finland)
L. Fauch, Univ. of Eastern Finland (Finland)
R. Saarenheimo, Univ. of Eastern Finland (Finland)
E. Nippolainen, Univ. of Eastern Finland (Finland)
A. A. Kamshilin, Univ. of Eastern Finland (Finland)

Published in SPIE Proceedings Vol. 7469:
ROMOPTO 2009: Ninth Conference on Optics: Micro- to Nanophotonics II
Valentin I. Vlad, Editor(s)

© SPIE. Terms of Use
Back to Top