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Proceedings Paper

Effective nonlinear refractive index of nano-porous silicon and its dependence on porosity and light wavelength
Author(s): Tatiana Bazaru; Valentin I. Vlad; Adrian Petris; Mihaela Miu
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Paper Abstract

In this paper, we study the dependence of effective optical linear and nonlinear refractive indices of nano-porous silicon layers on crystalline silicon substrates on fill fraction, at different light wavelengths in visible and near-infrared. Simple approximative formulae, in the frame of Bruggeman's formalism, that describe the dependences of effective optical linear and nonlinear refractive indices of nano-porous silicon on fill fractions and on wavelength, in the range of 620 - 1000 nm, are derived. Experimental results with reflection intensity scan show a good agreement with the data provided by our formulae and the exact results of Boyd-Bruggeman's formalism for the third order nonlinearity, in the case nanoporous silicon with different porosity and at light wavelengths in the mentioned spectral range.

Paper Details

Date Published: 17 May 2010
PDF: 9 pages
Proc. SPIE 7469, ROMOPTO 2009: Ninth Conference on Optics: Micro- to Nanophotonics II, 74690D (17 May 2010); doi: 10.1117/12.866770
Show Author Affiliations
Tatiana Bazaru, National Institute for Laser, Plasma and Radiation Physics (Romania)
Valentin I. Vlad, National Institute for Laser, Plasma and Radiation Physics (Romania)
Adrian Petris, National Institute for Laser, Plasma and Radiation Physics (Romania)
Mihaela Miu, National Institute for Research and Development in Microtechnologies (Romania)


Published in SPIE Proceedings Vol. 7469:
ROMOPTO 2009: Ninth Conference on Optics: Micro- to Nanophotonics II
Valentin I. Vlad, Editor(s)

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