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Proceedings Paper

Study on mechanical properties and damage behaviors of Kevlar fiber reinforced epoxy composites by digital image correlation technique under optical microscope
Author(s): Xiang Gao; Wenquan Shao; Hongwei Ji
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Paper Abstract

Kevlar fiber-reinforced epoxy (KFRE) composites are widely used in the fields of aerospace, weapon, shipping, and civil industry, due to their outstanding capabilities. In this paper, mechanical properties and damage behaviors of KFRE laminate (02/902) were tested and studied under tension condition. To precisely measure the tensile mechanical properties of the material and investigate its micro-scale damage evolution, a micro-image measuring system with in-situ tensile device was designed. The measuring system, by which the in-situ tensile test can be carried out and surface morphology evolution of the tensile specimen can be visually monitored and recorded during the process of loading, includes an ultra-long working distance zoom microscope and a in-situ tensile loading device. In this study, a digital image correlation method (DICM) was used to calculate the deformation of the tensile specimen under different load levels according to the temporal series images captured by an optical microscope and CCD camera. Then, the elastic modulus and Poisson's ratio of the KFRE was obtained accordingly. The damage progresses of the KFRE laminates were analyzed. Experimental results indicated that: (1) the KFRE laminate (02/902) is almost elastic, its failure mode is brittle tensile fracture.(2) Mechanical properties parameters of the material are as follows: elastic modulus is 14- 16GPa, and tensile ultimate stress is 450-480 Mpa respectively. (3) The damage evolution of the material is that cracks appear in epoxy matrix firstly, then, with the increasing of the tensile loading, matrix cracks add up and extend along a 45° angle direction with tensile load. Furthermore, decohesion between matrix and fibers as well as delamination occurs. Eventually, fibers break and the material is damaged.

Paper Details

Date Published: 22 October 2010
PDF: 6 pages
Proc. SPIE 7657, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 76571L (22 October 2010); doi: 10.1117/12.866731
Show Author Affiliations
Xiang Gao, Tianjin Univ. of Commerce (China)
Wenquan Shao, Tianjin Univ. of Commerce (China)
Hongwei Ji, Tianjin Univ. of Commerce (China)


Published in SPIE Proceedings Vol. 7657:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
Tianchun Ye; Sen Han; Masaomi Kameyama; Song Hu, Editor(s)

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