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Proceedings Paper

Microscale linear birefringence measurement
Author(s): Qing-Lin Wu; Peng Hao; Shi-Yuan Duan; Zhang-Yuan Lei; Ke-Yi Wang
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Paper Abstract

A new method for linear birefringence measurement in micro-scale is presented. Mueller matrix is used to represent the anisotropy properties of sample, optical fiber probe of scanning optical near-field microscopy (SNOM) and other optical components. Two polarization modulators are used to complete the quantitative measurement. Firstly, the Mueller matrix of the probe is calculated by analyzing the output signal without sample. Together with the matrix of the probe, the elements of the Mueller matrix of sample could be calculated sequentially. The principle and realization method of the scheme for linear birefringence measurement are presented. The result shows that the dual-modulator-based system can separate the anisotropy of probe and sample, which could not be distinguished in the current scheme that using only one polarization modulator.

Paper Details

Date Published: 11 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76563A (11 October 2010); doi: 10.1117/12.866718
Show Author Affiliations
Qing-Lin Wu, Univ. of Science and Technology of China (China)
Peng Hao, Univ. of Science and Technology of China (China)
Shi-Yuan Duan, Univ. of Science and Technology of China (China)
Zhang-Yuan Lei, Univ. of Science and Technology of China (China)
Ke-Yi Wang, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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