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Proceedings Paper

Study on high-performance whole spectrum and multi-band antireflective films on ZnS optical windows
Author(s): Tao Zhang; Xian-he Chen; Jun-xia Chen; Hai-wei Liu; Ju-yi Chen
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Paper Abstract

As a result of the rapid development of optoelectronic technology based on modern optoelectronic devices in laser, infrared and micro optics etc, Optoelectronic Products, which can be applied in both day and night observation, infrared thermal imaging display system and laser ranging devices, came into view and were improved rapidlly. In order to minimize system size and weight, optical system products generally are used in wide spectrum and common optical windows. Windows materials commonly use whole spectrum ZnS, In order to reduce its high reflectance while to harden the surface, thus full spectrum, multi-band antireflection film came into being. Muti-band antireflection films, with excellent spectral properties, mechanical properties and environmental adaptability, were studied by means of material selection, rational design of coatings, ion-assisted technology and the temperature selection, etc. Films were measured in visible, 1.06μm and infrared region with transmittance of 95%~97%. The actual results of technology tests met the optical components JB/T8226-1999 coating standards.

Paper Details

Date Published: 6 October 2010
PDF: 7 pages
Proc. SPIE 7655, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 76551E (6 October 2010); doi: 10.1117/12.866705
Show Author Affiliations
Tao Zhang, Henan PingYuan Optics Electronics Co., Ltd. (China)
Xian-he Chen, Henan PingYuan Optics Electronics Co., Ltd. (China)
Jun-xia Chen, Henan PingYuan Optics Electronics Co., Ltd. (China)
Hai-wei Liu, Henan PingYuan Optics Electronics Co., Ltd. (China)
Ju-yi Chen, Henan PingYuan Optics Electronics Co., Ltd. (China)


Published in SPIE Proceedings Vol. 7655:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yoshiharu Namba; David D. Walker; Shengyi Li, Editor(s)

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