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Proceedings Paper

X-ray integrated digital imaging system based on a-si flat panel detector
Author(s): Jian Fu; Bin Li; Baihong Jiang
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Paper Abstract

X-ray phase contrast imaging (X-PCI) is one of the novel imaging methods. For the low density substance, it provides better images than the conventional X-ray attenuation imaging. In order to get a high-quality image, X-PCI adopts the high spatial resolution image intensifier as the detector. However, the X-ray attenuation imaging usually adopts the high sensitivity a-si flat panel detector (FPD) as the detector. So it is currently one of the questions in the field of X-ray imaging how to realize these two functions at a system: X-ray attenuation imaging and X-PCI. An X-ray integrated digital imaging system based on FPD is designed and developed after analyzing the imaging principle of X-PCI and the imaging feature of FPD. The results from simulation and experiments in this system show that the X-PCI image can be acquired without affecting the quality of the conventional X-ray attenuation image. It demonstrates the possibility to realize these two functions at a system.

Paper Details

Date Published: 22 October 2010
PDF: 6 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 76585K (22 October 2010); doi: 10.1117/12.866689
Show Author Affiliations
Jian Fu, Beijing Univ. of Aeronautics and Astronautics (China)
Bin Li, Beijing Univ. of Aeronautics and Astronautics (China)
Baihong Jiang, Beijing Univ. of Aeronautics and Astronautics (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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