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Proceedings Paper

Photogrammetry research for FAST eleven-meter reflector panel surface shape measurement
Author(s): Rongwei Zhou; Lichun Zhu; Weimin Li; Jingwen Hu; Xuebing Zhai
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Paper Abstract

In order to design and manufacture the Five-hundred-meter Aperture Spherical Radio Telescope (FAST) active reflector measuring equipment, measurement on each reflector panel surface shape was presented, static measurement of the whole neutral spherical network of nodes was performed, real-time dynamic measurement at the cable network dynamic deformation was undertaken. In the implementation process of the FAST, reflector panel surface shape detection was completed before eleven-meter reflector panel installation. Binocular vision system was constructed based on the method of binocular stereo vision in machine vision, eleven-meter reflector panel surface shape was measured with photogrammetry method. Cameras were calibrated with the feature points. Under the linearity camera model, the lighting spot array was used as calibration standard pattern, and the intrinsic and extrinsic parameters were acquired. The images were collected for digital image processing and analyzing with two cameras, feature points were extracted with the detection algorithm of characteristic points, and those characteristic points were matched based on epipolar constraint method. Three-dimensional reconstruction coordinates of feature points were analyzed and reflective panel surface shape structure was established by curve and surface fitting method. The error of reflector panel surface shape was calculated to realize automatic measurement on reflector panel surface shape. The results show that unit reflector panel surface inspection accuracy was 2.30mm, within the standard deviation error of 5.00mm. Compared with the requirement of reflector panel machining precision, photogrammetry has fine precision and operation feasibility on eleven-meter reflector panel surface shape measurement for FAST.

Paper Details

Date Published: 13 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76565M (13 October 2010); doi: 10.1117/12.866649
Show Author Affiliations
Rongwei Zhou, National Astronomical Observatories (China)
Lichun Zhu, National Astronomical Observatories (China)
Weimin Li, Univ. of Science and Technology of China (China)
Jingwen Hu, National Astronomical Observatories (China)
Xuebing Zhai, National Astronomical Observatories (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

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