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Proceedings Paper

Research and development of AOTF based NIR spectrometer
Author(s): Hui Zhang; ShuJun Li; ManYu Bao; Qi Wen; WeiPing Wang; HongFeng Yan; XiaoChao Zhang; Zhi Wang; RuiJun Wang
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Paper Abstract

In this paper, brief review of modern spectral techniques and instruments based on AOTF (Acousto-optic Tunable Filter) is presented. Total configuration of the infrared spectrometer with AOTF technique and part main module concrete design is introduced. Such as, Light source is collimated by fiber assembled lens, which can enhance diffraction light and separate diffraction light from transmission light; A MCU (Micro Controlling Unit) controls DDS (Direct Digital Synthesizer) to realize the radio-frequency driver; Real-time differential spectroscopy has been created by two photoelectric sensors, which reduced SNR (signal-to-noise ratio) obviously. Furthermore, the spectrum signal pre-treatment software and application software design is summarized. The self-made AOTF spectrometer can scan the pass-band of the spectrometer between 800nm and 1700nm with a bandwidth of 2nm at 800nm and 9nm at 1700nm by changing the radio-frequency (RF) driver frequency from 70 MHz to 20MHz. The experiment results show that the function of wave number vs scanning frequency has good linearity. The complete instrument used milk powder for sample, which found that the absorbing peak between measured spectrum and standard spectrum is coherent. The AOTF spectrometer is immune to orientation changes or even severe mechanical shock and vibrations, making it ideal for operation in harsh industrial environments. The actual application proves that it has high spectral resolution, high scanning speed and high signal output.

Paper Details

Date Published: 6 October 2010
PDF: 9 pages
Proc. SPIE 7655, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 76552V (6 October 2010); doi: 10.1117/12.866648
Show Author Affiliations
Hui Zhang, Chinese Academy of Agricultural Mechanization Sciences (China)
ShuJun Li, Chinese Academy of Agricultural Mechanization Sciences (China)
ManYu Bao, Chinese Academy of Agricultural Mechanization Sciences (China)
Qi Wen, Chinese Academy of Agricultural Mechanization Sciences (China)
WeiPing Wang, Chinese Academy of Agricultural Mechanization Sciences (China)
HongFeng Yan, Chinese Academy of Agricultural Mechanization Sciences (China)
XiaoChao Zhang, Chinese Academy of Agricultural Mechanization Sciences (China)
Zhi Wang, Chinese Academy of Agricultural Mechanization Sciences (China)
RuiJun Wang, Chinese Academy of Agricultural Mechanization Sciences (China)


Published in SPIE Proceedings Vol. 7655:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yoshiharu Namba; David D. Walker; Shengyi Li, Editor(s)

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