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Proceedings Paper

Multi-object spectral imaging based on MEMS
Author(s): Yuheng Chen; Yiqun Ji; Jiankang Zhou; Xinhua Chen; Weimin Shen
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Paper Abstract

The primary compact high resolution imaging spectrometer was developed and reported. Due to its numerous wave bands the original image data is always in a huge scale and costs a tremendous process overhead, but the data amount of the region of interest is as a rule in the order of thousandth, if not less, of that of the whole push-broom region. With a digital micromirror device (DMD), only the region of interesting object is imaged by the imaging spectrometer, which results in a distinct reduction of data quantity and a high data compression ratio. A DMD of high turning rate and residential time adjustability is used as a spatial light modulator to fulfill the object selection function. It is placed after the fore objective and able to reflect the object to either the panchromatic CCD camera channel or the imaging spectrometer channel. The position of the object can be firstly determined through the image interpretation from panchromatic imaging channel and a DMD control command is executed to switch the corresponding mirrors to the imaging spectrometer channel, thus only the object region of interest is imaged by the spectrometer. The multiple objects of both printed patterns and real leaves are accurately determined and selected according to their different locality and shape features. The panchromatic and hyperspectral image data are both collected for further effective object recognition.

Paper Details

Date Published: 22 October 2010
PDF: 10 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 765834 (22 October 2010); doi: 10.1117/12.866607
Show Author Affiliations
Yuheng Chen, Soochow Univ. (China)
Yiqun Ji, Soochow Univ. (China)
Jiankang Zhou, Soochow Univ. (China)
Xinhua Chen, Soochow Univ. (China)
Weimin Shen, Soochow Univ. (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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