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Proceedings Paper

Merging algorithm of vector graphics primitive based on reliability index for engineering drawings
Author(s): Bin Cheng; Shusheng Zhang; Yunfei Shi
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Paper Abstract

Vectorizing recognition for engineering drawings is currently one of the most active research topics in the domain of pattern recognition. The merging algorithm of vector graphics primitive based on reliability index is presented. According to the dimension of vector basic graphics primitive, the reliability index of vector basic graphics primitive is defined, and then the reliability index of vector graphics primitive is set. Based on the reliability index, the vector graphic primitive is divided into two groups. One is the vector graphics primitive with high reliability index, the other is the vector graphics primitive with low reliability index. Firstly, Taking the graphics primitive with high reliability index as seed graphics primitive to carry out the merging algorithm, when searching the all vector basic graphics primitive is completed, and then the second merging algorithm is produced taking the vector graphics primitive with high reliability index as extending seed until the all vector graphics primitive is searched completely. The algorithm is developed based on the engineering drawing recognition system (EDRS) to merge the basic graphics primitive obtained by EDRS. The algorithm presents good results to merge the vector basic graphics primitive.

Paper Details

Date Published: 19 August 2010
PDF: 7 pages
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78201B (19 August 2010); doi: 10.1117/12.866605
Show Author Affiliations
Bin Cheng, Northwestern Polytechnical Univ. (China)
Xi'an Univ. of Architecture & Technology (China)
Shusheng Zhang, Northwestern Polytechnical Univ. (China)
Yunfei Shi, Northwestern Polytechnical Univ. (China)


Published in SPIE Proceedings Vol. 7820:
International Conference on Image Processing and Pattern Recognition in Industrial Engineering
Shaofei Wu; Zhengyu Du; Shaofei Wu; Zhengyu Du; Shaofei Wu; Zhengyu Du, Editor(s)

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