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Proceedings Paper

Novel method to examine phase object by the use of TFT-LCD
Author(s): Rongli Guo; Baoli Yao; Jun Han; Xun Yu; Liang Nie; Cunli Duan; Fan Wang
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Paper Abstract

A novel method of using Thin Film Transistor-Liquid Crystal Display(TFT-LCD) as phase filter in Zernike phase contrast method is introduced. First, theoretical analysis of using TFT-LCD as programmable phase modulator instead of conventional phase contrast plate to filter the spectrum is conducted. Then the phase modulation property curve of the used TFT-LCD is measured which is function of gray scales in modified Mach-Zehnder interferometer, and frequency filtering is used to eliminate interferogram's noise and the correlation method is adopted to determine the mini-displacement of interference fringe. At last, Experiment conducted in 4F system. The result showed that the method is effective in qualitative observation of phase distribution for a small phase object.

Paper Details

Date Published: 11 October 2010
PDF: 8 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76563D (11 October 2010); doi: 10.1117/12.866452
Show Author Affiliations
Rongli Guo, Xi'an Technological Univ. (China)
Xi'an Institute of Optics and Precision Mechanics (China)
Graduate School of the Chinese Academy of Sciences (China)
Baoli Yao, Xi'an Institute of Optics and Precision Mechanics (China)
Jun Han, Xi'an Technological Univ. (China)
Xun Yu, Xi'an Technological Univ. (China)
Liang Nie, Xi'an Technological Univ. (China)
Cunli Duan, Xi'an Technological Univ. (China)
Fan Wang, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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