Share Email Print
cover

Proceedings Paper

Research on the precision measurement of super-low reflectivity
Author(s): Hao-yu Yuan; Zong-gui Lu; Yan-wen Xia; Zhi-tao Peng; Hua Liu; Long-bo Xu; Zhi-hong Sun; Jun Tang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Introduced a high-precision measurement of measured the super-low reflectivity and small sampling angle. Using single reflect way measured, and compare with re-swatch. Testing the reflectance of the sampling mirror which be used on TIL, and analyze the error. Research results indicate, the main factor which affect result is energy detector error and energy detector linearity. This methods is easy and have high-precision, it can be used to measure the super-low reflectivity sampling mirror reflectance.

Paper Details

Date Published: 12 October 2010
PDF: 7 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 765665 (12 October 2010); doi: 10.1117/12.866381
Show Author Affiliations
Hao-yu Yuan, Chinese Academy of Engineering Physics (China)
Zong-gui Lu, Chinese Academy of Engineering Physics (China)
Yan-wen Xia, Chinese Academy of Engineering Physics (China)
Zhi-tao Peng, Chinese Academy of Engineering Physics (China)
Hua Liu, Chinese Academy of Engineering Physics (China)
Long-bo Xu, Chinese Academy of Engineering Physics (China)
Zhi-hong Sun, Chinese Academy of Engineering Physics (China)
Jun Tang, Chinese Academy of Engineering Physics (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top