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Proceedings Paper

Performance evaluation of an IGBT module by thermal analysis using fiber Bragg grating
Author(s): João Paulo Bazzo; Tiago Lukasievicz; Marcio Vogt; Mario L. S. Martins; Hypolito J. Kalinowski; Jean C. C. Silva
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Paper Abstract

This paper proposes a new method to estimate the energy losses in insulated gate bipolar transistors (IGBT) modules. The technique is based on measuring the temperature of the semiconductor junction through optical sensors based on fiber Bragg gratings. The IGBT module is monitored through software, enabling a real-time evaluation of performance, which facilitates the analysis of the device in different operating conditions. The results are compared with conventional techniques to validate the method.

Paper Details

Date Published: 9 September 2010
PDF: 4 pages
Proc. SPIE 7653, Fourth European Workshop on Optical Fibre Sensors, 76533Y (9 September 2010); doi: 10.1117/12.866360
Show Author Affiliations
João Paulo Bazzo, Univ. Tecnológica Federal do Paraná (Brazil)
Tiago Lukasievicz, Univ. Tecnológica Federal do Paraná (Brazil)
Marcio Vogt, Univ. Tecnológica Federal do Paraná (Brazil)
Mario L. S. Martins, Univ. Tecnológica Federal do Paraná (Brazil)
Hypolito J. Kalinowski, Univ. Tecnológica Federal do Paraná (Brazil)
Jean C. C. Silva, Univ. Tecnológica Federal do Paraná (Brazil)


Published in SPIE Proceedings Vol. 7653:
Fourth European Workshop on Optical Fibre Sensors

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