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Proceedings Paper

Digital speckle correlation method based on wavelet transform using micro-displacement measurement
Author(s): Yuping Tai; Xinzhong Li
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Paper Abstract

As an un-damage measurement technique, the digital speckle correlation method (DSCM) has been used in many measurement applications by advantage of its fast, sample and low requirement of the environment. However, its calculation efficiency and the accuracy were poor. Here, a novel digital speckle correlation method based on wavelet transform was proposed. Firstly, the dynamic speckle patterns generated by the sample were recorded, and then, the multi-scale analyse of wavelet transform were using in DSCM. Furthermore, employing the optimum noise reduction strategy, the dynamic speckle patterns were decomposed using symlets wavelet family, after that, the correlation registers were conducted. In this study, the efficiency and accuracy of this method were thoroughly investigated by theories and experiments. Compared to the traditional DSCM, the accuracy of this new method is improved dramatically and the relative error is less than 1%. Furthermore, the calculated consuming time is decreased to half of the traditional DSCM.

Paper Details

Date Published: 16 October 2010
PDF: 5 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76565P (16 October 2010); doi: 10.1117/12.866301
Show Author Affiliations
Yuping Tai, Henan Univ. of Science and Technology (China)
Xinzhong Li, Henan Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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