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Proceedings Paper

Linearity measurement for image-intensified CCD
Author(s): Yuhuan Zhao; Liwei Zhang; Feng Yan; Yongqiang Gu; Liying Wan
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Paper Abstract

To the characteristic of the ultraviolet CCD (UV ICCD), technique of the linearity measurement of the UV ICCD camera is studied based on the theory of radiometry. Approach of linearity measurement is discussed, and a kind of measurement system of the UV ICCD has been developed based on the method of neutral density filter. It is very important that the transmittance of the filter is independent of the wavelength in the method of neutral density filter. Black metal screen mesh with different transmittance is used in our system, and calibration of the filters' transmittance in different working positions has been done. Meanwhile, to assure the uniform of the received radiation on the target of the detector at any test points, an integrating sphere is placed behind the neutral filter to balance light. The whole measurement system mainly consists of a deuterium lamp with high stabilization, the attenuation film with transmission, integrating sphere, optical guide and electro-shift platform. Auto control is realized via special software during the test. With this instrument, the linearity of the UV ICCD was measured. Experimental results show that the nonlinearity of the UV ICCD under fixed-gain is less than 2% and the uncertainty of measurement system is less than 4%.

Paper Details

Date Published: 11 October 2010
PDF: 5 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 765637 (11 October 2010); doi: 10.1117/12.866287
Show Author Affiliations
Yuhuan Zhao, Henan Polytechnic Univ. (China)
Liwei Zhang, Henan Polytechnic Univ. (China)
Feng Yan, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Yongqiang Gu, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Liying Wan, Dalian Univ. of Foreign Languages (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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