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Proceedings Paper

Modulation transfer function measurement of sampled imaging systems in field test
Author(s): Le Yang; Qiang Sun; Jian Wang; Jianzhong Zhang
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Paper Abstract

A digital mirror device (DMD) based light projector was developed as the target generator in modulation transfer function (MTF) measurement. In order to overcome the sampling-scene phase effect in MTF measurement of sampled imaging systems, a method using random targets is introduced to yield a phase-averaged MTF. The main potential problem of implementing this method is the fact that the stationary assumption of the random targets may be vitiated in practical measurement, especially in field test due to the ill condition. We provide an efficient model-independent way of analyzing and isolating the spectral contents arising from these additional contributions to MTF measurement. Algorithms with adaptive parameter selection were also developed for spectral estimation of the test image in order to overcome the challenge brought by the size limit of the test matrices for one certain field of view derived from the isoplantic region. The MTF measurement of a CCD video imager is used to demonstrate the measurement technique and illustrate the benefits over other methods. In order to validate the results, comparisons have been made between MTF measurements of imager implemented using this method and bar target direct measurements.

Paper Details

Date Published: 16 October 2010
PDF: 9 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76565I (16 October 2010); doi: 10.1117/12.866223
Show Author Affiliations
Le Yang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of CAS (China)
Qiang Sun, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Jian Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Jianzhong Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of CAS (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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