Share Email Print
cover

Proceedings Paper

Key technology of data registration for large aperture aspheric surface measurement
Author(s): Tongqun Ren; Yinbiao Guo; Xiaolong Ke
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Large measuring range and high resolution are always contradictories in practical measurement for large aperture aspheric surface. They must be met simultaneously in high precision measurement. Stitching method based on data registration is an effective way to resolve this contradiction. Aiming at the problem of rapid searching corresponding points, a key problem in offset sampling point set registration under rectangular coordinate system, a complete and effective approach is described in this paper. The original and destination point sets are registered roughly according to initial transformation and then projected to x-y plane. The intersection of two planar point sets' minimal bounding rectangle is solved to reduce the original points to be matched. The convex boundary of destination point set is solved and then principle of connected graphs is employed to judge whether one original point lies in destination point set. Strategy of space separating is employed to accelerate the neighboring points searching process. For each original point, its neighboring points belonging to a small area are solved. Subsequently, quadratic surface fitting is performed based on these neighboring points. Then method of Point-to-(Tangent) Plane is used to calculate its corresponding point. An emulation experiment is performed and experimental results are presented to show the feasibility of the proposed methods. It can realize rapid corresponding points searching effectively and meet the high precision registration under the situation of offset sampling.

Paper Details

Date Published: 12 October 2010
PDF: 7 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76566Y (12 October 2010); doi: 10.1117/12.866116
Show Author Affiliations
Tongqun Ren, Xiamen Univ. (China)
Yinbiao Guo, Xiamen Univ. (China)
Xiaolong Ke, Xiamen Univ. (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top