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Proceedings Paper

A low complexity metric for optical signal quality evaluation
Author(s): Jin Xie; Mats Öberg; Zak Keirn
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Paper Details

Date Published:
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Proc. SPIE 7730, Optical Data Storage 2010, 77301Y; doi: 10.1117/12.866103
Show Author Affiliations
Jin Xie, Marvell Semiconductor, Inc. (United States)
Mats Öberg, Marvell Semiconductor Inc. (United States)
Zak Keirn, Marvell Semiconductor Inc. (United States)


Published in SPIE Proceedings Vol. 7730:
Optical Data Storage 2010

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