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Proceedings Paper

A CMOS transimpedance amplifier for pulsed laser range finder
Author(s): Yi Chen; Genghua Huang; Rong Shu; Binyong Wang
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Paper Abstract

The pulsed laser range finding has been extensively applied in space exploration, military use and industry, due to its advantages over other methods of non-contact ranging in simplicity, non-cooperativeness of objects, long detecting range and short range acquisition time. The integration of its receiver channel will be beneficial to weight-lightening, miniaturization and mass production of the laser range finder. A transimpedance amplifier for receiver channel of pulsed range finder is designed using 0.6-μm CMOS technology in this work. It consists of transimpedance pre-amplifier, R-2R resistors ladder variable attenuator and post-amplifier. A regulated cascade circuit (RGC) is used to isolate the input capacitor from input node of transimpedance pre-amplifier, reducing the bandwidth suppression caused by large input capacitor. R-2R variable attenuator is implemented for digital gain control, achieving a total gain control range of 42dB with 7 steps and 6dB per step. Simulation shows that the circuit achieves a bandwidth of 83 MHz with the presence of a 5-pF input capacitor, and a maximum transimpedance of 125.5dBΩ, meeting the requirement of high-precision pulsed laser range finder.

Paper Details

Date Published: 22 October 2010
PDF: 9 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 765860 (22 October 2010); doi: 10.1117/12.866013
Show Author Affiliations
Yi Chen, Shanghai Institute of Technical Physics (China)
Genghua Huang, Shanghai Institute of Technical Physics (China)
Rong Shu, Shanghai Institute of Technical Physics (China)
Binyong Wang, Shanghai Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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