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Proceedings Paper

A kind of composite Shack-Hartmann wavefront sensor with switchable CCD and ICCD detectors
Author(s): Xuejun Zhang; Kai Wei; Changhui Rao; Yudong Zhang
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Paper Abstract

A Shack-Hartmann WaveFront Sensor (SHWFS) with photoelectric detector which can be switched expediently between CCD and Intensified CCD (ICCD) is designed to get high detectivity or high sampling frequency according to the requirement. By switching the photoelectric detector, the Adaptive Optical System (AOS) can detect fainter stars with ICCD-based SHWFS when the atmosphere turbulence is changing slowly, and it can also work for bright stars with CCD-based SHWFS when the atmosphere turbulence is changing rapidly. The detectivities of CCD-based SHWFS and ICCD-based SHWFS are analyzed and compared in this paper according to the parameters of AOS for 1.8-meter telescope of the Yunnan Astronomical Observatory (YAO). The preliminary analysis result shows that the faintest stars which can be detected by ICCD-based SHWFS is about 3.2 magnitude dimmer than that can be detected by CCD-based SHWFS. The CCD-based SHWFS and the ICCD-base SHWFS can detect stars with magnitude of about 7 and 10 respectively.

Paper Details

Date Published: 7 October 2010
PDF: 8 pages
Proc. SPIE 7655, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 765534 (7 October 2010); doi: 10.1117/12.866012
Show Author Affiliations
Xuejun Zhang, Institute of Optics and Electronics (China)
The Key Lab. on Adaptive Optics (China)
Graduate School of Chinese Academy of Sciences (China)
Kai Wei, Institute of Optics and Electronics (China)
The Key Lab. on Adaptive Optics (China)
Graduate School of Chinese Academy of Sciences (China)
Changhui Rao, Institute of Optics and Electronics (China)
The Key Lab. on Adaptive Optics (China)
Yudong Zhang, Institute of Optics and Electronics (China)
The Key Lab. on Adaptive Optics (China)


Published in SPIE Proceedings Vol. 7655:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yoshiharu Namba; David D. Walker; Shengyi Li, Editor(s)

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