Share Email Print
cover

Proceedings Paper

Phase-stepping method for whole-field photoelastic stress analysis using plane polariscope setup
Author(s): Xusheng Zhang; Lingfeng Chen; Chuan He
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A new six-step phase shifting method is presented in this paper to determine the phase retardation for whole-field photoelastic stress analysis in optical glass based on the plane polariscope setup. This new phase stepping strategy is of no quarter wave plate errors and with less intensity variations of emerging light. By this method, it's not necessary to determine the isoclinic angles in advance when measuring the phase retardations, so the data processing will be simplified and the isoclinic angle errors will cause no influnces on the measurement. A plane polariscope is setup including a LED array light source, rotatable dichroic polymer film polarizer and analyser, a digital CCD camera and image grab system. Two mica waveplates with known phase retardances are measured, and the experimental results agree well with the those values. This method is expected to be used for the stress induced birefringence test in optical glass.

Paper Details

Date Published: 13 October 2010
PDF: 7 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76565B (13 October 2010); doi: 10.1117/12.865999
Show Author Affiliations
Xusheng Zhang, Beijing Institute of Technology (China)
Lingfeng Chen, Beijing Institute of Technology (China)
Chuan He, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

© SPIE. Terms of Use
Back to Top