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Proceedings Paper

Joining of silicon carbide ceramic for optical application by reaction bonded technology
Author(s): Aifang Zhang; Yichao Chen; Zhiqiang Chen; Hong Liu; Jingzhong Fang
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Paper Abstract

Silicon carbide ceramic is a prospective candidate for the next generation space telescope with a large-scale reflector. In order to reduce the cost of the fabrication of complex shaped component, the joining technology of SiC ceramic is investigated. In this work, SiC ceramic was joined by reaction bonded technology using SiC green preforms successfully. SiC green preforms were fastened together by epoxy resin and joined during the process of one-step Si infiltration. The microstructure and composition of SiC substrate ceramic and the joint is homogeneous and there have no micro-cracks or defects in the joint. The interface reaction layer become smaller and even disappears with carefully surface grinding of the SiC green preforms. The surface roughness of the joined SiC in the area of the joint is 0.95nm rms and there has no significant difference in the surface roughness of the joint area and SiC substrate ceramic. The bending strength of the joined SiC is about 300MPa and the crack occurred inside the SiC substrate but not in the joint. The most important advantage of the method is the joining of SiC ceramics was achieved via one-step Si infiltration process and the joints are homogeneous with the substrate, which is economical and effective. The mechanical and optical properties of the joined SiC can satisfy the requirement of the large-scale telescope in many astronomical instruments.

Paper Details

Date Published: 14 October 2010
PDF: 5 pages
Proc. SPIE 7654, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 765410 (14 October 2010); doi: 10.1117/12.865809
Show Author Affiliations
Aifang Zhang, Institute of Optics and Electronics (China)
Yichao Chen, Institute of Optics and Electronics (China)
Zhiqiang Chen, Institute of Optics and Electronics (China)
Hong Liu, Institute of Optics and Electronics (China)
Jingzhong Fang, Institute of Optics and Electronics (China)


Published in SPIE Proceedings Vol. 7654:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
Wenhan Jiang; Myung K. Cho; Fan Wu, Editor(s)

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