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Proceedings Paper

Threat assessment of aerial target in ultra-wide field of view infrared image
Author(s): Yulong Zhou; Mingqiang Xing; Yongzhong Wang
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Paper Abstract

When the target is several miles away from the ultra-wide field of view (UWFV) infrared warning system, it will be a point target in the infrared image, so there is no the target information of distance, geometry and texture without which it is hard to assess the threat of target accurately. It is very important for the air defense command and decision making to have a correct threat assessment of the aerial target, and at present there are few reports about the aerial target threat assessment of the UWFV infrared warning system. The characteristic of the UWFV infrared image is analyzed. A laser range finder is used to measure the initial distance of each target which will be sent back to the infrared warning system. Together with the target information of initial distance, gray value, course angle and angular altitude, considering the nonlinear characteristic of aerial target threat assessment, the threat assessment method based on RBF neural network is presented for its good self-adaptive and self study ability to solve nonlinear complex problems. After simulation experiment, it is found that this method is available and effective.

Paper Details

Date Published: 22 October 2010
PDF: 5 pages
Proc. SPIE 7658, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology, 76582L (22 October 2010); doi: 10.1117/12.865786
Show Author Affiliations
Yulong Zhou, Ordnance Engineering College (China)
Mingqiang Xing, Ordnance Engineering College (China)
Yongzhong Wang, Ordnance Engineering College (China)


Published in SPIE Proceedings Vol. 7658:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology
Yadong Jiang; Bernard Kippelen; Junsheng Yu, Editor(s)

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