
Proceedings Paper
Evaluation of anti-vibration capability of the wavefront testing method in time- and spatial-domainFormat | Member Price | Non-Member Price |
---|---|---|
$14.40 | $18.00 |
![]() |
GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. | Check Access |
Paper Abstract
The proposed wavefront testing method in time- and spatial-domain takes advantage of both active and passive phaseshifting.
It obtains stable wavefront with random noises removed after processing of large amount of serially collected
interforograms. Since the environmental vibration and air turbulence are adopted as the passive phase-shifting source,
this method performs well in normal laboratory environment without special vibration isolation or air flow control. This
method has application prospect in large-aperture optical surface test because it can help simplify the system and reduce
the cost and difficulty in fabrication. In order to quantitatively evaluate the anti-vibration capability of this method, the
influence of vibration on the measurement accuracy is simulated and analyzed. It is confirmed that corresponding to
certain accuracy tolerance, the product of maximum tolerant vibration amplitude and frequency is invariable. This very
product is adopted as the threshold indicating anti-vibration capability. More conclusions can be drawn after analysis
about the influence of active phase-shifting velocity, sampling frame frequency and relative sampling frame number on
the measurement accuracy: when the relative sampling frame number is fixed, the anti-vibration capability of the method
is increased with active phase-sifting velocity.
Paper Details
Date Published: 13 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76566O (13 October 2010); doi: 10.1117/12.865742
Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76566O (13 October 2010); doi: 10.1117/12.865742
Show Author Affiliations
Lei Tang, Beijing Research Institute of Special Mechanical and Electric Technology (China)
Beijing Institute of Technology (China)
Qun Hao, Beijing Institute of Technology (China)
Qiu-dong Zhu, Beijing Institute of Technology (China)
Beijing Institute of Technology (China)
Qun Hao, Beijing Institute of Technology (China)
Qiu-dong Zhu, Beijing Institute of Technology (China)
Jian-hua Wang, Beijing Research Institute of Special Mechanical and Electric Technology (China)
Chao-wei Zhang, Beijing Research Institute of Special Mechanical and Electric Technology (China)
Beijing Institute of Technology (China)
Airforce Radar Academy (China)
Chao-wei Zhang, Beijing Research Institute of Special Mechanical and Electric Technology (China)
Beijing Institute of Technology (China)
Airforce Radar Academy (China)
Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)
© SPIE. Terms of Use
