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Proceedings Paper

Evaluation of anti-vibration capability of the wavefront testing method in time- and spatial-domain
Author(s): Lei Tang; Qun Hao; Qiu-dong Zhu; Jian-hua Wang; Chao-wei Zhang
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Paper Abstract

The proposed wavefront testing method in time- and spatial-domain takes advantage of both active and passive phaseshifting. It obtains stable wavefront with random noises removed after processing of large amount of serially collected interforograms. Since the environmental vibration and air turbulence are adopted as the passive phase-shifting source, this method performs well in normal laboratory environment without special vibration isolation or air flow control. This method has application prospect in large-aperture optical surface test because it can help simplify the system and reduce the cost and difficulty in fabrication. In order to quantitatively evaluate the anti-vibration capability of this method, the influence of vibration on the measurement accuracy is simulated and analyzed. It is confirmed that corresponding to certain accuracy tolerance, the product of maximum tolerant vibration amplitude and frequency is invariable. This very product is adopted as the threshold indicating anti-vibration capability. More conclusions can be drawn after analysis about the influence of active phase-shifting velocity, sampling frame frequency and relative sampling frame number on the measurement accuracy: when the relative sampling frame number is fixed, the anti-vibration capability of the method is increased with active phase-sifting velocity.

Paper Details

Date Published: 12 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76566O (12 October 2010); doi: 10.1117/12.865742
Show Author Affiliations
Lei Tang, Beijing Research Institute of Special Mechanical and Electric Technology (China)
Beijing Institute of Technology (China)
Qun Hao, Beijing Institute of Technology (China)
Qiu-dong Zhu, Beijing Institute of Technology (China)
Jian-hua Wang, Beijing Research Institute of Special Mechanical and Electric Technology (China)
Chao-wei Zhang, Beijing Research Institute of Special Mechanical and Electric Technology (China)
Beijing Institute of Technology (China)
Airforce Radar Academy (China)


Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)

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